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Chip and Wafer Inspection Systems


Wafer and Chip Inspection for the Semiconductor Industry

Chip Inspection System

This Chip Inspection System measures the uniformity, size, shape, and searches for defects in the plating of the connectors of electronic components.

Each Unit Under Test (UUT) is compared to a known good part for that particular model number.

Chip Inspection System
Wafer Inspection System

Wafer Inspection System

The Wafer Inspection System and Probe Software is for automated testing of silicon wafers containing superconducting devices in cryogenic temperature ranges in high-vacuum environments. 

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