This Chip Inspection System measures the uniformity, size, shape, and searches for defects in the plating of the connectors of electronic components.
Each Unit Under Test (UUT) is compared to a known good part for that particular model number.
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Chip and Wafer Inspection Systems
Inspection Systems for the Semiconductor Industry
Chip Inspection System
Wafer Inspection System
The Wafer Inspection System and Probe Software is for automated testing of silicon wafers containing superconducting devices in cryogenic temperature ranges in high-vacuum environments.
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