• Mon - Fri: 8.00 am - 5.00 pm EST

Semiconductor Plating Inspection Systems


Inspection System for Semiconductor Wafers

Microchip Plating Inspection System

The Chip Plating Inspection System measures the uniformity, size, shape, as well as, searches for defects in the plating of the connectors of electronic components.

Each Unit Under Test (UUT) is compared to a known good part for that particular model number.

Contact us today to discuss your unique situation.

Need a Consultation?

Save Time and Money with an Engineered Solution from Sciotex